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CMSIS-DSP/Testing/GeneratedInclude/BasicTestsF32_decl.h

53 lines
1.6 KiB
C

void test_add_f32();
void test_sub_f32();
void test_mult_f32();
void test_negate_f32();
void test_offset_f32();
void test_scale_f32();
void test_dot_prod_f32();
void test_abs_f32();
// Pattern IDs
static const int INPUT1_F32_ID=0;
static const int INPUT2_F32_ID=1;
static const int REF_ADD_F32_ID=2;
static const int REF_SUB_F32_ID=3;
static const int REF_MULT_F32_ID=4;
static const int REF_NEGATE_F32_ID=5;
static const int REF_OFFSET_F32_ID=6;
static const int REF_SCALE_F32_ID=7;
static const int REF_DOT_3_F32_ID=8;
static const int REF_DOT_4N_F32_ID=9;
static const int REF_DOT_4N1_F32_ID=10;
static const int REF_ABS_F32_ID=11;
// Output IDs
static const int OUT_SAMPLES_F32_ID=0;
static const int OUT_STATE_F32_ID=1;
// Test IDs
static const int TEST_ADD_F32_1=1;
static const int TEST_ADD_F32_2=2;
static const int TEST_ADD_F32_3=3;
static const int TEST_SUB_F32_4=4;
static const int TEST_SUB_F32_5=5;
static const int TEST_SUB_F32_6=6;
static const int TEST_MULT_F32_7=7;
static const int TEST_MULT_F32_8=8;
static const int TEST_MULT_F32_9=9;
static const int TEST_NEGATE_F32_10=10;
static const int TEST_NEGATE_F32_11=11;
static const int TEST_NEGATE_F32_12=12;
static const int TEST_OFFSET_F32_13=13;
static const int TEST_OFFSET_F32_14=14;
static const int TEST_OFFSET_F32_15=15;
static const int TEST_SCALE_F32_16=16;
static const int TEST_SCALE_F32_17=17;
static const int TEST_SCALE_F32_18=18;
static const int TEST_DOT_PROD_F32_19=19;
static const int TEST_DOT_PROD_F32_20=20;
static const int TEST_DOT_PROD_F32_21=21;
static const int TEST_ABS_F32_22=22;
static const int TEST_ABS_F32_23=23;
static const int TEST_ABS_F32_24=24;